Bi-Level Deadline Scaling for Admission Control in Mixed-Criticality Systems

Alejandro Masrur, Dirk Müller 0002, Matthias Werner 0001. Bi-Level Deadline Scaling for Admission Control in Mixed-Criticality Systems. In 21st IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, RTCSA 2015, Hong Kong, China, August 19-21, 2015. pages 100-109, IEEE, 2015. [doi]

Abstract

Abstract is missing.