Francisco Massa, Bryan C. Russell, Mathieu Aubry. Deep Exemplar 2D-3D Detection by Adapting from Real to Rendered Views. In 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016. pages 6024-6033, IEEE Computer Society, 2016. [doi]
Abstract is missing.