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Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design

Yutaka Masuda, Jun Nagayama, TaiYu Cheng, Tohru Ishihara, Yoichi Momiyama, Masanori Hashimoto. Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 1260-1265, IEEE, 2021. [doi]

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