Life expectancy and characterization of capacitive RF MEMS switches

Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève. Life expectancy and characterization of capacitive RF MEMS switches. Microelectronics Reliability, 50(9-11):1692-1696, 2010. [doi]

Abstract

Abstract is missing.