Kevin Matocha, In-Hwan Ji, Xuning Zhang, Sauvik Chowdhury. SiC Power MOSFETs: Designing for Reliability in Wide-Bandgap Semiconductors. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-8, IEEE, 2019. [doi]
Abstract is missing.