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Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits

Anzhela Matrosova, Eugeniy Mitrofanov, Toral Shah. Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits. In 2015 IEEE East-West Design & Test Symposium, EWDTS 2015, Batumi, Georgia, September 26-29, 2015. pages 1-4, IEEE Computer Society, 2015. [doi]

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