Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama. 1/::::f::::-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions, 88-C(2):247-254, 2005. [doi]
Abstract is missing.