Comparison of Knowledge Acquisition Methods for Dynamic Scheduling of Wafer Test Processes with Unpredictable Testing Errors

Tsubasa Matsuo, Masahiro Inuiguchi, Kenichiro Masunaga. Comparison of Knowledge Acquisition Methods for Dynamic Scheduling of Wafer Test Processes with Unpredictable Testing Errors. JACIII, 19(1):58-66, 2015. [doi]

Abstract

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