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The Effectiveness of I::DDQ::, Functional and Scan Tests: How Many Fault Coverages Do We Need?

Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang. The Effectiveness of I::DDQ::, Functional and Scan Tests: How Many Fault Coverages Do We Need?. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 168-177, IEEE Computer Society, 1992.

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