Best Methods for At-Speed Testing?

Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh. Best Methods for At-Speed Testing?. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 460-461, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.