Current ratios: a self-scaling technique for production IDDQ testing

Peter C. Maxwell, Pete O Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman. Current ratios: a self-scaling technique for production IDDQ testing. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 1148-1156, IEEE Computer Society, 2000.

Abstract

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