Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue. Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-2, IEEE, 2016. [doi]
Abstract is missing.