Daniel Mazor, Michael L. Bushnell, David J. Mulligan, Richard J. Blaikie. Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 657-664, IEEE Computer Society, 2007. [doi]
Abstract is missing.