Patrick M. McInerney, Juan M. Banda, Rafal A. Angryk. On Using SIFT Descriptors for Image Parameter Evaluation. In Wei Ding 0003, Takashi Washio, Hui Xiong, George Karypis, Bhavani M. Thuraisingham, Diane J. Cook, Xindong Wu, editors, 13th IEEE International Conference on Data Mining Workshops, ICDM Workshops, TX, USA, December 7-10, 2013. pages 32-39, IEEE Computer Society, 2013. [doi]
Abstract is missing.