Automating security tests for industrial automation devices using neural networks

João Paulo S. Medeiros, Allison C. Cunha, Agostinho M. Brito, Paulo S. Motta Pires. Automating security tests for industrial automation devices using neural networks. In Proceedings of 12th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2007, September 25-28, 2007, Patras, Greece. pages 772-775, IEEE, 2007. [doi]

Abstract

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