G. Cardoso Medeiros, Moritz Fieback, A. Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui. Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. In 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.