Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui. A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 792-797, IEEE, 2020. [doi]
@inproceedings{MedeirosGWFJTH20,
title = {A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs},
author = {Guilherme Cardoso Medeiros and Cemil Cem Gürsoy and Lizhou Wu and Moritz Fieback and Maksim Jenihhin and Mottaqiallah Taouil and Said Hamdioui},
year = {2020},
doi = {10.23919/DATE48585.2020.9116278},
url = {https://doi.org/10.23919/DATE48585.2020.9116278},
researchr = {https://researchr.org/publication/MedeirosGWFJTH20},
cites = {0},
citedby = {0},
pages = {792-797},
booktitle = {2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020},
publisher = {IEEE},
isbn = {978-3-9819263-4-7},
}