A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui. A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 792-797, IEEE, 2020. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.