A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Guilherme Cardoso Medeiros, Cemil Cem G├╝rsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui. A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 792-797, IEEE, 2020. [doi]

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