Vishal J. Mehta, Malgorzata Marek-Sadowska, Zhiyuan Wang, Kun-Han Tsai, Janusz Rajski. Delay Fault Diagnosis for Non-Robust Test. In 7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. pages 463-472, IEEE Computer Society, 2006. [doi]
Abstract is missing.