Chunlei Mei, Maoxiang Yi, Zhifei Shen. Decreasing SoC Test Power Dissipation and Test Data Volume Based on Pattern Recombination. In IEEE 10th International Conference on Trust, Security and Privacy in Computing and Communications, TrustCom 2011, Changsha, China, 16-18 November, 2011. pages 701-705, IEEE, 2011. [doi]
Abstract is missing.