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Matteo Meneghini, D. Barbisan, Y. Bilenko, M. Shatalov, J. Yang, R. Gaska, Gaudenzio Meneghesso, Enrico Zanoni. Defect-related degradation of Deep-UV-LEDs. Microelectronics Reliability, 50(9-11):1538-1542, 2010. [doi]
Abstract is missing.