Matteo Meneghini, Simone Vaccari, Matteo Dal Lago, Stefano Marconi, Marco Barbato, Nicola Trivellin, Alessio Griffoni, Alberto Alfier, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni. ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. Microelectronics Reliability, 54(6-7):1143-1149, 2014. [doi]
Abstract is missing.