Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya. Input pattern classification for transistor level testing of BiCMOS circuits. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 457-462, IEEE Computer Society, 1994. [doi]
Abstract is missing.