Allison J. Mercer, Ryan K. James, Gisele Bennett, Priyank Patel, Chase Johnston, James Cai. RFID testing and evaluation for an RF-harsh environment. In 2011 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2011, Sitges, Spain, September 15-16, 2011. pages 95-102, IEEE, 2011. [doi]
Abstract is missing.