Francisco Mesalles, Hector Villacorta, Michel Renovell, VĂctor H. Champac. Behavior and test of open-gate defects in FinFET based cells. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-6, IEEE, 2016. [doi]
Abstract is missing.