Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo. CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 417-422, IEEE Computer Society, 2002. [doi]
Abstract is missing.