Sergey Mikhtonyuk, Maksim Davydov, Roman Hwang, Dmitry Shcherbin. IEEE 1500 compliant test wrapper generation tool for VHDL models. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 495-499, IEEE, 2010. [doi]
Abstract is missing.