Full-scan LBIST with capture-per-cycle hybrid test points

Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada. Full-scan LBIST with capture-per-cycle hybrid test points. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-9, IEEE, 2017. [doi]

Abstract

Abstract is missing.