A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits - researchr publication

researchr

You are not signed in
Sign in
Sign up

Spencer K. Millican, Kewal K. Saluja. A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits. In 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems, Mumbai, India, January 5-9, 2014. pages 20-25, IEEE, 2014. [doi]

Abstract is missing.

runs on WebDSL