Yinghua Min, Stephen Y. H. Su. Testing functional faults in VLSI. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 384-392, ACM/IEEE, 1982. [doi]
Abstract is missing.