On-chip testing of embedded transducers

Salvador Mir, Libor Rufer, Bernard Courtois. On-chip testing of embedded transducers. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 463, IEEE Computer Society, 2004. [doi]

Abstract

Abstract is missing.