Nunzio Mirabella, Michelangelo Grosso, Giovanna Franchino, Salvatore Rinaudo, Ioannis Deretzis, Antonino La Magna, Matteo Sonza Reorda. Comparing different solutions for testing resistive defects in low-power SRAMs. In LATS. pages 1-6, 2021. [doi]
Abstract is missing.