On the test of single via related defects in digital VLSI designs

Nunzio Mirabella, Maurizio Ricci, Michelangelo Grosso. On the test of single via related defects in digital VLSI designs. In 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2020, Novi Sad, Serbia, April 22-24, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

Abstract is missing.