Test Reuse at System Level

José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman. Test Reuse at System Level. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 318-319, IEEE Computer Society, 1998. [doi]

Authors

José M. Miranda

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Scott Davidson

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Peter Dziel

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Saman Adham

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Steve Millman

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