Variability aware modeling for yield enhancement of SRAM and logic

Miguel Miranda, Paul Zuber, Petr Dobrovolný, Philippe Roussel. Variability aware modeling for yield enhancement of SRAM and logic. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1153-1158, IEEE, 2011. [doi]

@inproceedings{MirandaZDR11,
  title = {Variability aware modeling for yield enhancement of SRAM and logic},
  author = {Miguel Miranda and Paul Zuber and Petr Dobrovolný and Philippe Roussel},
  year = {2011},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763193},
  researchr = {https://researchr.org/publication/MirandaZDR11},
  cites = {0},
  citedby = {0},
  pages = {1153-1158},
  booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
  publisher = {IEEE},
  isbn = {978-1-61284-208-0},
}