On the avalanche ruggedness of optimized termination structure for 600 V punch-through IGBTs

Paolo Mirone, Luca Maresca, Michele Riccio, Giovanni Breglio, Andrea Irace. On the avalanche ruggedness of optimized termination structure for 600 V punch-through IGBTs. Microelectronics Reliability, 58:17-25, 2016. [doi]

@article{MironeMRBI16,
  title = {On the avalanche ruggedness of optimized termination structure for 600 V punch-through IGBTs},
  author = {Paolo Mirone and Luca Maresca and Michele Riccio and Giovanni Breglio and Andrea Irace},
  year = {2016},
  doi = {10.1016/j.microrel.2015.11.027},
  url = {http://dx.doi.org/10.1016/j.microrel.2015.11.027},
  researchr = {https://researchr.org/publication/MironeMRBI16},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {58},
  pages = {17-25},
}