On the avalanche ruggedness of optimized termination structure for 600 V punch-through IGBTs

Paolo Mirone, Luca Maresca, Michele Riccio, Giovanni Breglio, Andrea Irace. On the avalanche ruggedness of optimized termination structure for 600 V punch-through IGBTs. Microelectronics Reliability, 58:17-25, 2016. [doi]

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