A design flow to maximize yield/area of physical devices via redundancy

Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta. A design flow to maximize yield/area of physical devices via redundancy. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.