A New Approach for Automatic Test Pattern Generation in Register Transfer Level Circuits

Mohammad Mirzaei, Mahmoud Tabandeh, Bijan Alizadeh, Zainalabedin Navabi. A New Approach for Automatic Test Pattern Generation in Register Transfer Level Circuits. IEEE Design & Test of Computers, 30(4):49-59, 2013. [doi]

Abstract

Abstract is missing.