Evolving More Testable Digital Combinational Circuits

Nahid Mirzaie, Seyyed Javad Seyyed Mahdavi, Karim Mohammadi. Evolving More Testable Digital Combinational Circuits. In Hamid R. Arabnia, Ashu M. G. Solo, editors, Proceedings of the 2010 International Conference on Computer Design, CDES 2010, July 12-15, 2010, Las Vegas Nevada, USA. pages 40-45, CSREA Press, 2010.

Abstract

Abstract is missing.