7.6 A 90nm embedded 1T-MONOS flash macro for automotive applications with 0.07mJ/8kB rewrite energy and endurance over 100M cycles under Tj of 175°C

Hidenori Mitani, Ken Matsubara, Hiroshi Yoshida, Takashi Hashimoto, Hideaki Yamakoshi, Shinichiro Abe, Takashi Kono, Yasuhiko Taito, Takashi Ito, Takashi Krafuji, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi. 7.6 A 90nm embedded 1T-MONOS flash macro for automotive applications with 0.07mJ/8kB rewrite energy and endurance over 100M cycles under Tj of 175°C. In 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016, San Francisco, CA, USA, January 31 - February 4, 2016. pages 140-141, IEEE, 2016. [doi]

@inproceedings{MitaniMYHYAKTIK16,
  title = {7.6 A 90nm embedded 1T-MONOS flash macro for automotive applications with 0.07mJ/8kB rewrite energy and endurance over 100M cycles under Tj of 175°C},
  author = {Hidenori Mitani and Ken Matsubara and Hiroshi Yoshida and Takashi Hashimoto and Hideaki Yamakoshi and Shinichiro Abe and Takashi Kono and Yasuhiko Taito and Takashi Ito and Takashi Krafuji and Kenji Noguchi and Hideto Hidaka and Tadaaki Yamauchi},
  year = {2016},
  doi = {10.1109/ISSCC.2016.7417946},
  url = {http://dx.doi.org/10.1109/ISSCC.2016.7417946},
  researchr = {https://researchr.org/publication/MitaniMYHYAKTIK16},
  cites = {0},
  citedby = {0},
  pages = {140-141},
  booktitle = {2016 IEEE International Solid-State Circuits Conference, ISSCC 2016, San Francisco, CA, USA, January 31 - February 4, 2016},
  publisher = {IEEE},
  isbn = {978-1-4673-9467-3},
}