Debasis Mitra, Subhasis Bhattacharjee, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sujit T. Zachariah, Sandip Kundu. Test Pattern Generation for Power Supply Droop Faults. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 343-348, IEEE Computer Society, 2006. [doi]
Abstract is missing.