An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic

Sanjoy Mitra, Debaprasad Das. An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic. J. Electronic Testing, 36(3):327-342, 2020. [doi]

Abstract

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