Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang. Logic soft errors in sub-65nm technologies design and CAD challenges. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 2-4, ACM, 2005. [doi]
Abstract is missing.