Ralf Mitsching, Carsten Weise, Dominik Franke, Thomas Gerlitz, Stefan Kowalewski. Coping with Complexity of Testing Models for Real-Time Embedded Systems. In Fifth International Conference on Secure Software Integration and Reliability Improvement, SSIRI 2011, 27-29 June, 2011, Jeju Island, Korea - Companion Volume. pages 128-135, IEEE, 2011. [doi]
Abstract is missing.