Exploring Optimal Deep Learning Models for Image-based Malware Variant Classification

Rikima Mitsuhashi, Takahiro Shinagawa. Exploring Optimal Deep Learning Models for Image-based Malware Variant Classification. In Hong Va Leong, Sahra Sedigh Sarvestani, Yuuichi Teranishi, Alfredo Cuzzocrea, Hiroki Kashiwazaki, Dave Towey, Ji-Jiang Yang, Hossain Shahriar, editors, 46th IEEE Annual Computers, Software, and Applications Conferenc, COMPSAC 2022, Los Alamitos, CA, USA, June 27 - July 1, 2022. pages 779-788, IEEE, 2022. [doi]

Abstract

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