Compact modeling of dynamic trap density evolution for predicting circuit-performance aging

Mitiko Miura-Mattausch, Hidenori Miyamoto, Hideyuki Kikuchihara, Tapas K. Maiti, N. Rohbani, Dondee Navarro, Hans Jürgen Mattausch. Compact modeling of dynamic trap density evolution for predicting circuit-performance aging. Microelectronics Reliability, 80:164-175, 2018. [doi]

Abstract

Abstract is missing.