Kohei Miyase, Yudai Kawano, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara. A Static Method for Analyzing Hotspot Distribution on the LSI. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 73-78, IEEE, 2019. [doi]
Abstract is missing.