Osamu Mizuno, Hideaki Hata. An Integrated Approach to Detect Fault-Prone Modules Using Complexity and Text Feature Metrics. In Tai-Hoon Kim, Hojjat Adeli, editors, Advances in Computer Science and Information Technology, AST/UCMA/ISA/ACN 2010 Conferences, Miyazaki, Japan, June 23-25, 2010. Joint Proceedings. Volume 6059 of Lecture Notes in Computer Science, pages 457-468, Springer, 2010. [doi]
Abstract is missing.