Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-Trong. Test coverage and post-verification defects: A multiple case study. In Proceedings of the Third International Symposium on Empirical Software Engineering and Measurement, ESEM 2009, October 15-16, 2009, Lake Buena Vista, Florida, USA. pages 291-301, 2009. [doi]
Abstract is missing.